SERVICES
Ultra-high resolution characterization and analysis
of the widest range of samples, with extreme ease!
Precise, true nanometer scale information. Superb contrast at high and low kV. Highly resolved sub-100 V imaging. Fast analysis. Ultra-high resolution investigation of the most charging or contaminating specimens using low vacuum. These have already been integral features of the Nova™ NanoSEM field-emission SEM for many years. Equipped EDS channel for elemental Xray Analysis
FEI’s exclusive DualBeamTM – pushing the limits of extreme high resolution characterization in 2D and 3D, nanoprototyping, and sample preparation
The Helios NanoLabTM 650 features FEI’s most recent advances in field emission SEM (FESEM) and focused ion beam (FIB) technologies and their combined use. As FEI’s 11th DualBeamTM platform, it is designed to access a new world of extreme high resolution (XHR) 2D and 3D characterization, nanoprototyping, and higher quality sample preparation for our HRTEM tests.
HRTEM – Tecnai F20
The Tecnai G2 F20 is a highly advanced, state-of-the-art 200 kV scanning transmission electron microscope (S/TEM)with an unrivalled task-oriented user interface. Running under Windows® XP operating system, it offers high performance with versatility, high productivity with ease
of use, and all in a personal environment. The accessories that may be fitted onto these systems – e.g. STEM, CCD cameras, EDX , and energy filters – are embedded into the user interface, allowing differently experienced operators to fully utilize the functionality of
the total system through one coherent interface. It used for various samples analysis from Bio application to material science application. We accept all types of samples in each field of research that needs to study by HRTEM.
